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Accueil du site > Divers > Equipe 2-HOPE Equipe > Gilles POULLAIN


6 juillet 2018


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Professeur des Universités 33ème section.
Enseignement à l’IUT de Caen, Département « Mesures Physiques », Chimie générale, Matériaux, Optique.

Research Interests :

Key words :Piezo/ferroelectric thin films, magnetic thin films, heterostructures, sputtering, physical properties modelling.
Topics :
(i) Ferroelectric and piezoelectric thin films. Modelling the properties of Metal/Ferroelectric/Metal(MFM) structures.
(ii) Ferroelectric/Magnetostrictif heterostructures : magneto-electric (ME) properties. Ferroelectric thin films of PZT or PLZT and magnetic film of Tb1-xDyxFe2-y (TERFENOL-D).

Some publications :

An easy way to measure accurately the direct magnetoelectric voltage coefficient of thin film devices
G. Poullain, J. More-Chevalier, C. Cibert, R. Bouregba.
J. Magn. Magn. Mat. 422 (2017) p. 344-347.

Eddy currents : A misleading contribution when measuring magneto-electric voltage coefficients of thin film devices
J. More-Chevalier, C. Cibert, R. Bouregba, G. Poullain.
J. Appl. Phys. 117, 154104 (2015).

Analysis of the influence of stress signal frequency on fatigue of ferroelectric thin films
G. Poullain, C. Cibert, R. Bouregba.
J. Appl. Phys., 106, 124105, 2009.

Investigation of thickness dependence of the ferroelectric properties of PbZr0.6Ti0.4O3 thin film capacitors
R. Bouregba, G. Le Rhun,G. Poullain, G. Leclerc.
J. Appl. Phys., 99, 034102, 2006.

A model for fatigue in ferroelectric thin film based on trapping of carriers at interfacial states.
G. Le Rhun, G Poullain, R. Bouregba,
J. Appl. Phys., 96, p. 3876-3882, 2004.

Asymmetrical leakage currents as possible origin of the polarisation offsets observed in compositionally graded ferroelectric films.
R. Bouregba, G. Poullain, B. Vilquin, G. Le Rhun.
J. Appl. Phys., 93, p. 5583-5591, 2003.

Orientation control of textured PZT thin films sputtered on silicon substrate with TiOx seeding.
R. Bouregba, G. Poullain, B. Vilquin, H. Murray.
Mat. Res. Bull., vol 35, 9, p. 1381-90, 2000.